Dominik Kasprowicz (Selection)

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2 Dominik Kasprowicz, Witold A. Pleskacz: Improvement of integrated circuit testing reliability by using the defect based approach. Microelectronics Reliability 43(6): 945-953 (2003)

1 Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz: CMOS Standard Cells Characterization for Defect Based Testing. DFT 2001: 384-

Selection of 2 from 3 records - Dominik Kasprowicz has 7 coauthors

2		Dominik Kasprowicz, Witold A. Pleskacz: Improvement of integrated circuit testing reliability by using the defect based approach. Microelectronics Reliability 43(6): 945-953 (2003)
1		Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz: CMOS Standard Cells Characterization for Defect Based Testing. DFT 2001: 384-