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| 1 |       | Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz: CMOS Standard Cells Characterization for Defect Based Testing. DFT 2001: 384- |
Selection of 1 from 3 records - Dominik Kasprowicz has 7 coauthors
Copyright © 2009-12-30 by Michael Ley (ley@uni-trier.de)