Steven Kasapi (Selection)

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3 Ulrike Kindereit, Christian Boit, Uwe Kerst, Steven Kasapi, Radu Ispasoiu, Roy Ng, William K. Lo: Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology. Microelectronics Reliability 48(8-9): 1322-1326 (2008)

Selection of 1 from 6 records - Steven Kasapi has 26 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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