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| 6 | Prashant Singh, Cheng Zhuo, Eric Karl, David Blaauw, Dennis Sylvester: Sensor-Driven Reliability and Wearout Management. IEEE Design & Test of Computers 26(6): 40-49 (2009) | |
| 5 | Eric Karl, Dennis Sylvester, David Blaauw: Analysis of System-Level Reliability Factors and Implications on Real-Time Monitoring Methods for Oxide Breakdown Device Failures. ISQED 2008: 391-395 | |
| 4 | Eric Karl, David Blaauw, Dennis Sylvester, Trevor N. Mudge: Multi-Mechanism Reliability Modeling and Management in Dynamic Systems. IEEE Trans. VLSI Syst. 16(4): 476-487 (2008) | |
| 3 | Eric Karl, David Blaauw, Dennis Sylvester, Trevor N. Mudge: Reliability modeling and management in dynamic microprocessor-based systems. DAC 2006: 1057-1060 | |
| 2 | Dennis Sylvester, David Blaauw, Eric Karl: ElastIC: An Adaptive Self-Healing Architecture for Unpredictable Silicon. IEEE Design & Test of Computers 23(6): 484-490 (2006) | |
| 1 | Eric Karl, Dennis Sylvester, David Blaauw: Timing error correction techniques for voltage-scalable on-chip memories. ISCAS (4) 2005: 3563-3566 |
Selection of 6 from 6 records - Eric Karl has 5 coauthors
Copyright © 2009-12-28 by Michael Ley (ley@uni-trier.de)