Rohit Kapur (Selection)

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6 Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams: A weighted random pattern test generation system. IEEE Trans. on CAD of Integrated Circuits and Systems 15(8): 1020-1025 (1996)

5 Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams: Design of an Efficient Weighted-Random-Pattern Generation System. ITC 1994: 491-500

Selection of 2 from 60 records - Rohit Kapur has 91 coauthors

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6		Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams: A weighted random pattern test generation system. IEEE Trans. on CAD of Integrated Circuits and Systems 15(8): 1020-1025 (1996)
5		Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams: Design of an Efficient Weighted-Random-Pattern Generation System. ITC 1994: 491-500