Seiji Kajihara (Selection)

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76 Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja: Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. DAC 2007: 527-532

74 Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang: A novel scheme to reduce power supply noise for high-quality at-speed scan testing. ITC 2007: 1-10

Selection of 2 from 101 records - Seiji Kajihara has 91 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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76		Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja: Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. DAC 2007: 527-532
74		Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang: A novel scheme to reduce power supply noise for high-quality at-speed scan testing. ITC 2007: 1-10