Bo Jiang (Selection)

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80 Yongguang Xiao, Minghua Tang, Jiancheng Li, Bo Jiang, John He: The influence of ferroelectric-electrode interface layer on the electrical characteristics of negative-capacitance ferroelectric double-gate field-effect transistors. Microelectronics Reliability 52(4): 757-760 (2012)

Selection of 1 from 87 records - Bo Jiang has 124 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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