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Kaspar M. B. Jansen (Selection)

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11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLXiaosong Ma, Kaspar M. B. Jansen, G. Q. Zhang, Willem D. van Driel, Olaf van der Sluis, Leo J. Ernst, C. Regards, Christian Gautier, Hélène Frémont: A fast moisture sensitivity level qualification method. Microelectronics Reliability 50(9-11): 1654-1660 (2010)
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. van Soestbergen, Leo J. Ernst, Kaspar M. B. Jansen, W. D. van Driel: Measuring the through-plane elastic modulus of thin polymer films in situ. Microelectronics Reliability 47(12): 1983-1988 (2007)
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLH. J. L. Bressers, W. D. van Driel, Kaspar M. B. Jansen, Leo J. Ernst, G. Q. Zhang: Correlation between chemistry of polymer building blocks and microelectronics reliability. Microelectronics Reliability 47(2-3): 290-294 (2007)
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLD. G. Yang, Kaspar M. B. Jansen, Leo J. Ernst, G. Q. Zhang, W. D. van Driel, H. J. L. Bressers, J. H. J. Janssen: Numerical modeling of warpage induced in QFN array molding process. Microelectronics Reliability 47(2-3): 310-318 (2007)
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLXiaosong Ma, Kaspar M. B. Jansen, Leo J. Ernst, W. D. van Driel, Olaf van der Sluis, G. Q. Zhang: Characterization of moisture properties of polymers for IC packaging. Microelectronics Reliability 47(9-11): 1685-1689 (2007)

Selection of 5 from 13 records - Kaspar M. B. Jansen has 28 coauthors

Last update 2012-09-10 CET by the DBLP TeamThis material is Open Data Content released under the ODC-BY 1.0 license — See also our legal information page