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James Jacob (Selection)

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15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPramit Chavda, James Jacob, Vishwani D. Agrawal: Optimizing Logic Design Using Boolean Transforms. VLSI Design 1998: 218-221
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJames Jacob, P. Srinivas Sivakumar, Vishwani D. Agrawal: Adder and Comparator Synthesis with Exclusive-OR Transform of Inputs. VLSI Design 1997: 514-515
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAnanta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal: On test coverage of path delay faults. VLSI Design 1996: 418-421
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal: Functional test generation for synchronous sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 15(7): 831-843 (1996)
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAnanta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal: An efficient automatic test generation system for path delay faults in combinational circuits. VLSI Design 1995: 161-165
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal: Functional test generation for non-scan sequential circuits. VLSI Design 1995: 47-52
6no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLP. R. Suresh Kumar, James Jacob, Mandyam-Komar Srinivas, Vishwani D. Agrawal: An Improved Deductive Fault Simulator. VLSI Design 1994: 307-310
4no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal: Finite State Machine Testing Based on Growth and Dissappearance Faults. FTCS 1992: 238-245
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJames Jacob, Vishwani D. Agrawal: Multiple fault detection in two-level multi-output circuits. J. Electronic Testing 3(2): 171-173 (1992)

Selection of 9 from 16 records - James Jacob has 13 coauthors

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