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Mary Jane Irwin (Selection)

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285Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRajaraman Ramanarayanan, Vijay Degalahal, Krishnan Ramakrishnan, Jungsub Kim, Vijaykrishnan Narayanan, Yuan Xie, Mary Jane Irwin, Kenan Unlu: Modeling Soft Errors at the Device and Logic Levels for Combinational Circuits. IEEE Trans. Dependable Sec. Comput. 6(3): 202-216 (2009)
178Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVijay Degalahal, Rajaraman Ramanarayanan, Narayanan Vijaykrishnan, Yuan Xie, Mary Jane Irwin: The Effect of Threshold Voltages on the Soft Error Rate. ISQED 2004: 503-508

Selection of 2 from 309 records - Mary Jane Irwin has 202 coauthors

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