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| 3 |       | Kazumi Hatayama, Mitsuji Ikeda, Masahiro Takakura, Satoshi Uchiyama, Yoriyuki Sakamoto: Application of a Design for Delay Testability Approach to High Speed Logic LSIs. Asian Test Symposium 1997: 112-115 |
Selection of 1 from 3 records - Mitsuji Ikeda has 8 coauthors
Copyright © 2010-01-02 by Michael Ley (ley@uni-trier.de)