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| 1 |       | Kazumi Hatayama, Mitsuji Ikeda, Terumine Hayashi, Masahiro Takakura, Kuniaki Kishida, Shun Ishiyama: Enhanced Delay Test Generator for High-Speed Logic LSIs. ITC 1989: 161-165 |
Selection of 1 from 3 records - Mitsuji Ikeda has 8 coauthors
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