Mitsuji Ikeda (Selection)

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2 Kazumi Hatayama, Kazunori Hikone, Mitsuji Ikeda, Terumine Hayashi: Sequential Test Generation Based on Real-Value Logic. ITC 1992: 41-48

1 Kazumi Hatayama, Mitsuji Ikeda, Terumine Hayashi, Masahiro Takakura, Kuniaki Kishida, Shun Ishiyama: Enhanced Delay Test Generator for High-Speed Logic LSIs. ITC 1989: 161-165

Selection of 2 from 3 records - Mitsuji Ikeda has 8 coauthors

2		Kazumi Hatayama, Kazunori Hikone, Mitsuji Ikeda, Terumine Hayashi: Sequential Test Generation Based on Real-Value Logic. ITC 1992: 41-48
1		Kazumi Hatayama, Mitsuji Ikeda, Terumine Hayashi, Masahiro Takakura, Kuniaki Kishida, Shun Ishiyama: Enhanced Delay Test Generator for High-Speed Logic LSIs. ITC 1989: 161-165