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Mingxu Huo (Selection)

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3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLXiaoyang Du, Shurong Dong, Yan Han, Juin J. Liou, Mingxu Huo, You Li, Qiang Cui, Dahai Huang, Demiao Wang: Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology. Microelectronics Reliability 48(7): 995-999 (2008)

Selection of 1 from 3 records - Mingxu Huo has 9 coauthors

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