Shi-Yu Huang (Selection)

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49 Yi-Chung Chang, Shi-Yu Huang, Chao-Wen Tzeng, Jack T. Yao: A fully cell-based design for timing measurement of memory. ITC 2011: 1-10

42 Chao-Wen Tzeng, Shi-Yu Huang: Split-Masking: An Output Masking Scheme for Effective Compound Defect Diagnosis in Scan Architecture With Test Compression. IEEE Trans. on CAD of Integrated Circuits and Systems 29(5): 834-839 (2010)

41 Chao-Wen Tzeng, Shi-Yu Huang: QC-Fill: An X-Fill method for quick-and-cool scan test. DATE 2009: 1142-1147

40 Chao-Wen Tzeng, Shi-Yu Huang: QC-Fill: Quick-and-Cool X-Filling for Multicasting-Based Scan Test. IEEE Trans. on CAD of Integrated Circuits and Systems 28(11): 1756-1766 (2009)

39 Chao-Wen Tzeng, Han-Chia Cheng, Shi-Yu Huang: Layout-Based Defect-Driven Diagnosis for Intracell Bridging Defects. IEEE Trans. on CAD of Integrated Circuits and Systems 28(5): 764-769 (2009)

38 Chao-Wen Tzeng, Jheng-Syun Yang, Shi-Yu Huang: A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques. ACM Trans. Design Autom. Electr. Syst. 13(1): (2008)

37 Chao-Wen Tzeng, Shi-Yu Huang: UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting. IEEE Design & Test of Computers 25(2): 132-140 (2008)

34 Chao-Wen Tzeng, J.-J. Hsu, Shi-Yu Huang: Robust paradigm for diagnosing hold-time faults in scan chains. IET Computers & Digital Techniques 1(6): 706-715 (2007)

Selection of 8 from 54 records - Shi-Yu Huang has 91 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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49		Yi-Chung Chang, Shi-Yu Huang, Chao-Wen Tzeng, Jack T. Yao: A fully cell-based design for timing measurement of memory. ITC 2011: 1-10
42		Chao-Wen Tzeng, Shi-Yu Huang: Split-Masking: An Output Masking Scheme for Effective Compound Defect Diagnosis in Scan Architecture With Test Compression. IEEE Trans. on CAD of Integrated Circuits and Systems 29(5): 834-839 (2010)
41		Chao-Wen Tzeng, Shi-Yu Huang: QC-Fill: An X-Fill method for quick-and-cool scan test. DATE 2009: 1142-1147
40		Chao-Wen Tzeng, Shi-Yu Huang: QC-Fill: Quick-and-Cool X-Filling for Multicasting-Based Scan Test. IEEE Trans. on CAD of Integrated Circuits and Systems 28(11): 1756-1766 (2009)
39		Chao-Wen Tzeng, Han-Chia Cheng, Shi-Yu Huang: Layout-Based Defect-Driven Diagnosis for Intracell Bridging Defects. IEEE Trans. on CAD of Integrated Circuits and Systems 28(5): 764-769 (2009)
38		Chao-Wen Tzeng, Jheng-Syun Yang, Shi-Yu Huang: A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques. ACM Trans. Design Autom. Electr. Syst. 13(1): (2008)
37		Chao-Wen Tzeng, Shi-Yu Huang: UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting. IEEE Design & Test of Computers 25(2): 132-140 (2008)
34		Chao-Wen Tzeng, J.-J. Hsu, Shi-Yu Huang: Robust paradigm for diagnosing hold-time faults in scan chains. IET Computers & Digital Techniques 1(6): 706-715 (2007)