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Shi-Yu Huang (Selection)

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49Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYi-Chung Chang, Shi-Yu Huang, Chao-Wen Tzeng, Jack T. Yao: A fully cell-based design for timing measurement of memory. ITC 2011: 1-10
42Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChao-Wen Tzeng, Shi-Yu Huang: Split-Masking: An Output Masking Scheme for Effective Compound Defect Diagnosis in Scan Architecture With Test Compression. IEEE Trans. on CAD of Integrated Circuits and Systems 29(5): 834-839 (2010)
41Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChao-Wen Tzeng, Shi-Yu Huang: QC-Fill: An X-Fill method for quick-and-cool scan test. DATE 2009: 1142-1147
40Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChao-Wen Tzeng, Shi-Yu Huang: QC-Fill: Quick-and-Cool X-Filling for Multicasting-Based Scan Test. IEEE Trans. on CAD of Integrated Circuits and Systems 28(11): 1756-1766 (2009)
39Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChao-Wen Tzeng, Han-Chia Cheng, Shi-Yu Huang: Layout-Based Defect-Driven Diagnosis for Intracell Bridging Defects. IEEE Trans. on CAD of Integrated Circuits and Systems 28(5): 764-769 (2009)
38Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChao-Wen Tzeng, Jheng-Syun Yang, Shi-Yu Huang: A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques. ACM Trans. Design Autom. Electr. Syst. 13(1): (2008)
37Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChao-Wen Tzeng, Shi-Yu Huang: UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting. IEEE Design & Test of Computers 25(2): 132-140 (2008)
34Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChao-Wen Tzeng, J.-J. Hsu, Shi-Yu Huang: Robust paradigm for diagnosing hold-time faults in scan chains. IET Computers & Digital Techniques 1(6): 706-715 (2007)

Selection of 8 from 54 records - Shi-Yu Huang has 91 coauthors

Last update 2012-09-10 CET by the DBLP TeamThis material is Open Data Content released under the ODC-BY 1.0 license — See also our legal information page