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Heng-Sheng Huang (Selection)

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1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLZhen-Ying Hsieh, Mu-Chun Wang, Chih Chen, Jia-Min Shieh, Yu-Ting Lin, Shuang-Yuan Chen, Heng-Sheng Huang: Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs. Microelectronics Reliability 49(8): 892-896 (2009)

Selection of 1 from 1 records - Heng-Sheng Huang has 6 coauthors

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