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| 3 | Kazumi Hatayama, Kazunori Hikone, T. Miyazaki, H. Yamada: A practical approach to instruction-based test generation for functional modules of VLSI processors. VTS 1997: 17-23 | |
| 2 | Kazumi Hatayama, Kazunori Hikone, Mitsuji Ikeda, Terumine Hayashi: Sequential Test Generation Based on Real-Value Logic. ITC 1992: 41-48 |
Selection of 2 from 3 records - Kazunori Hikone has 7 coauthors
Copyright © 2009-12-24 by Michael Ley (ley@uni-trier.de)