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Seiichiro Higashi (Selection)

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3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYanli Pei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki, Seiji Inumiya, Yasuo Nara: Evaluation of Dielectric Reliability of Ultrathin HfSiOxNy in Metal-Gate Capacitors. IEICE Transactions 90-C(5): 962-967 (2007)

Selection of 1 from 7 records - Seiichiro Higashi has 16 coauthors

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