S. Hidalgo (Selection)

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9 I. Cortés, P. Fernández-Martínez, D. Flores, S. Hidalgo, J. Rebollo: Superjunction LDMOS on thick-SOI technology for RF applications. Microelectronics Journal 39(6): 922-927 (2008)

8 I. Cortés, P. Fernández-Martínez, D. Flores, S. Hidalgo, J. Rebollo: Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors. Microelectronics Reliability 48(2): 173-180 (2008)

6 I. Cortés, J. Roig, D. Flores, J. Urresti, S. Hidalgo, J. Rebollo: Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. Microelectronics Reliability 45(3-4): 493-498 (2005)

5 J. Urresti, S. Hidalgo, D. Flores, J. Roig, I. Cortés, J. Rebollo: Lateral punch-through TVS devices for on-chip protection in low-voltage applications. Microelectronics Reliability 45(7-8): 1181-1186 (2005)

Selection of 4 from 11 records - S. Hidalgo has 50 coauthors

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9		I. Cortés, P. Fernández-Martínez, D. Flores, S. Hidalgo, J. Rebollo: Superjunction LDMOS on thick-SOI technology for RF applications. Microelectronics Journal 39(6): 922-927 (2008)
8		I. Cortés, P. Fernández-Martínez, D. Flores, S. Hidalgo, J. Rebollo: Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors. Microelectronics Reliability 48(2): 173-180 (2008)
6		I. Cortés, J. Roig, D. Flores, J. Urresti, S. Hidalgo, J. Rebollo: Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. Microelectronics Reliability 45(3-4): 493-498 (2005)
5		J. Urresti, S. Hidalgo, D. Flores, J. Roig, I. Cortés, J. Rebollo: Lateral punch-through TVS devices for on-chip protection in low-voltage applications. Microelectronics Reliability 45(7-8): 1181-1186 (2005)