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| 1 |       | Benoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun: Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ISQED 2007: 53-58 |
Selection of 1 from 1 records - Luc Hebrard has 3 coauthors
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