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| 2 |       | Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu: A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. ISQED 2007: 21-26 |
Selection of 1 from 5 records - Shiho Hagiwara has 6 coauthors
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