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Guido Groeseneken (Selection)

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19Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLGeorges G. E. Gielen, Peter H. N. De Wit, Elie Maricau, J. Loeckx, J. Martín-Martínez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría: Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE 2008: 1322-1327
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. Fernández, R. Rodríguez, M. Nafría, X. Aymerich, Ben Kaczer, Guido Groeseneken: FinFET and MOSFET preliminary comparison of gate oxide reliability. Microelectronics Reliability 46(9-11): 1608-1611 (2006)

Selection of 2 from 26 records - Guido Groeseneken has 100 coauthors

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