B. Grimber (Selection)

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1 A. Sozza, Christian Dua, Erwan Morvan, B. Grimber, S. L. Delage: A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. Microelectronics Reliability 45(9-11): 1617-1621 (2005)

Selection of 1 from 1 records - B. Grimber has 4 coauthors

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