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| 1 | J. Martín-Martínez, E. Amat, M. B. Gonzalez, P. Verheyen, R. Rodríguez, M. Nafría, X. Aymerich, Eddy Simoen: SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors. Microelectronics Reliability 50(9-11): 1263-1266 (2010) |
Selection of 1 from 1 records - M. B. Gonzalez has 7 coauthors
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