G. Ghidini (Selection)

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10 G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia: Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability 45(5-6): 857-860 (2005)

8 G. Ghidini, C. Capolupo, G. Giusto, A. Sebastiani, B. Stragliati, M. Vitali: Tunnel oxide degradation under pulsed stress. Microelectronics Reliability 45(9-11): 1337-1342 (2005)

7 G. Ghidini, A. Garavaglia, G. Giusto, A. Ghetti, R. Bottini, D. Peschiaroli, M. Scaravaggi, F. Cazzaniga, D. Ielmini: Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET. Microelectronics Reliability 43(8): 1221-1227 (2003)

Selection of 3 from 15 records - G. Ghidini has 39 coauthors

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10		G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia: Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability 45(5-6): 857-860 (2005)
8		G. Ghidini, C. Capolupo, G. Giusto, A. Sebastiani, B. Stragliati, M. Vitali: Tunnel oxide degradation under pulsed stress. Microelectronics Reliability 45(9-11): 1337-1342 (2005)
7		G. Ghidini, A. Garavaglia, G. Giusto, A. Ghetti, R. Bottini, D. Peschiaroli, M. Scaravaggi, F. Cazzaniga, D. Ielmini: Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET. Microelectronics Reliability 43(8): 1221-1227 (2003)