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A. Ghetti (Selection)

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4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLG. Ghidini, A. Garavaglia, G. Giusto, A. Ghetti, R. Bottini, D. Peschiaroli, M. Scaravaggi, F. Cazzaniga, D. Ielmini: Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET. Microelectronics Reliability 43(8): 1221-1227 (2003)

Selection of 1 from 6 records - A. Ghetti has 21 coauthors

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