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Robert Gauthier (Selection)

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4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLCiaran J. Brennan, Kiran V. Chatty, Jeff Sloan, Paul Dunn, Mujahid Muhammad, Robert Gauthier: Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs. Microelectronics Reliability 47(7): 1069-1073 (2007)
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFranco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda: Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFranco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson: Latchup Analysis Using Emission Microscopy. Microelectronics Reliability 43(9-11): 1603-1608 (2003)

Selection of 3 from 10 records - Robert Gauthier has 45 coauthors

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