Robert Gauthier (Selection)

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4 Ciaran J. Brennan, Kiran V. Chatty, Jeff Sloan, Paul Dunn, Mujahid Muhammad, Robert Gauthier: Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs. Microelectronics Reliability 47(7): 1069-1073 (2007)

2 Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda: Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245

1 Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson: Latchup Analysis Using Emission Microscopy. Microelectronics Reliability 43(9-11): 1603-1608 (2003)

Selection of 3 from 10 records - Robert Gauthier has 45 coauthors

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4		Ciaran J. Brennan, Kiran V. Chatty, Jeff Sloan, Paul Dunn, Mujahid Muhammad, Robert Gauthier: Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs. Microelectronics Reliability 47(7): 1069-1073 (2007)
2		Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda: Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245
1		Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson: Latchup Analysis Using Emission Microscopy. Microelectronics Reliability 43(9-11): 1603-1608 (2003)