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| 4 | Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: Built in Defect Prognosis for Embedded Memories. DDECS 2007: 167-172 | |
| 3 | Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: GALS Based Shared Test Architecture for Embedded Memories. ISCAS 2007: 157-160 | |
| 2 | Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis. ISVLSI 2007: 171-178 |
Selection of 3 from 5 records - Akhil Garg has 2 coauthors
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