Saakshi Gangwal (Selection)

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Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy: NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? ASP-DAC 2008: 726-731

Selection of 1 from 1 records - Saakshi Gangwal has 3 coauthors