Hideo Fujiwara (Selection)

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130 Hideyuki Ichihara, Tomoo Inoue, Naoki Okamoto, Toshinori Hosokawa, Hideo Fujiwara: An Effective Design for Hierarchical Test Generation Based on Strong Testability. Asian Test Symposium 2005: 288-293

Selection of 1 from 214 records - Hideo Fujiwara has 146 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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