Antoine Fuentes (Selection)

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2 René David, Antoine Fuentes: Fault Diagnosis of RAM's from Random Testing Experiments. IEEE Trans. Computers 39(2): 220-229 (1990)

1 René David, Antoine Fuentes, Bernard Courtois: Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989)

Selection of 2 from 2 records - Antoine Fuentes has 2 coauthors

2		René David, Antoine Fuentes: Fault Diagnosis of RAM's from Random Testing Experiments. IEEE Trans. Computers 39(2): 220-229 (1990)
1		René David, Antoine Fuentes, Bernard Courtois: Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989)