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Pascal Fouillat (Selection)

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15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAziz Machouat, G. Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, F. Essely: Effect of physical defect on shmoos in CMOS DSM technologies. Microelectronics Reliability 48(8-9): 1333-1338 (2008)

Selection of 1 from 17 records - Pascal Fouillat has 44 coauthors

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