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William D. Farwell (Selection)

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2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPiero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell: Analysis and Detection of Timing Failures in an Experimental Test Chip. ITC 1996: 691-700

Selection of 1 from 2 records - William D. Farwell has 7 coauthors

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