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C. Engel (Selection)

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1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLT. Pompl, C. Engel, H. Wurzer, M. Kerber: Soft breakdown and hard breakdown in ultra-thin oxides. Microelectronics Reliability 41(4): 543-551 (2001)

Selection of 1 from 2 records - C. Engel has 116 coauthors

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