Willem D. van Driel (Selection)

W. D. van Driel

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31 J. de Vries, W. Balemans, W. D. van Driel: Predictive modeling of board level shock-impact reliability of the HVQFN-family. Microelectronics Reliability 50(2): 228-234 (2010)

26 J. de Vries, M. Jansen, Willem D. van Driel: Solder-joint reliability of HVQFN-packages subjected to thermal cycling. Microelectronics Reliability 49(3): 331-339 (2009)

Selection of 2 from 34 records - Willem D. van Driel has 78 coauthors

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31		J. de Vries, W. Balemans, W. D. van Driel: Predictive modeling of board level shock-impact reliability of the HVQFN-family. Microelectronics Reliability 50(2): 228-234 (2010)
26		J. de Vries, M. Jansen, Willem D. van Driel: Solder-joint reliability of HVQFN-packages subjected to thermal cycling. Microelectronics Reliability 49(3): 331-339 (2009)