Robin Degraeve (Selection)

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9 Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt: Distribution and generation of traps in SiO₂/Al₂O₃ gate stacks. Microelectronics Reliability 47(4-5): 525-527 (2007)

Selection of 1 from 9 records - Robin Degraeve has 48 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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