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Stefaan Decoutere (Selection)

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8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLD. Marcon, X. Kang, J. Viaene, M. Van Hove, P. Srivastava, Stefaan Decoutere, R. Mertens, G. Borghs: GaN-based HEMTs tested under high temperature storage test. Microelectronics Reliability 51(9-11): 1717-1720 (2011)

Selection of 1 from 8 records - Stefaan Decoutere has 45 coauthors

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