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Cor Claeys (Selection)

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3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLH. Ohyama, Eddy Simoen, S. Kuroda, Cor Claeys, Y. Takami, T. Hakata, K. Kobayashi, M. Nakabayashi, H. Sunaga: Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle. Microelectronics Reliability 41(1): 79-85 (2001)
2no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Nakabayashi, H. Ohyama, Eddy Simoen, M. Ikegami, Cor Claeys, K. Kobayashi, M. Yoneoka, K. Miyahara: Reliability of polycrystalline silicon thin film resistors. Microelectronics Reliability 41(9-10): 1341-1346 (2001)
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLH. Ohyama, M. Nakabayashi, Eddy Simoen, Cor Claeys, T. Tanaka, T. Hirao, S. Onada, K. Kobayashi: Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation. Microelectronics Reliability 41(9-10): 1443-1448 (2001)

Selection of 3 from 14 records - Cor Claeys has 43 coauthors

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