![]() |
Ask others: ACM DL/Guide -
- CSB - MetaPress - Google - Bing - Yahoo
| 4 | Dong Xiang, Mingjing Chen, Jia-Guang Sun: Scan BIST with biased scan test signals. Science in China Series F: Information Sciences 51(7): 881-895 (2008) | |
| 2 | Dong Xiang, Mingjing Chen, Hideo Fujiwara: Using Weighted Scan Enable Signals to Improve Test Effectiveness of Scan-Based BIST. IEEE Trans. Computers 56(12): 1619-1628 (2007) |
Selection of 2 from 7 records - Mingjing Chen has 6 coauthors
Copyright © 2009-12-24 by Michael Ley (ley@uni-trier.de)