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Hao Chen (Selection)

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199Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJie Han, Hao Chen, Erin Boykin, José A. B. Fortes: Reliability evaluation of logic circuits using probabilistic gate models. Microelectronics Reliability 51(2): 468-476 (2011)

Selection of 1 from 258 records - Hao Chen has 380 coauthors

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