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Chih-Ang Chen (Selection)

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7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Ang Chen, Sandeep K. Gupta: Efficient BIST TPG design and test set compaction via input reduction. IEEE Trans. on CAD of Integrated Circuits and Systems 17(8): 692-705 (1998)
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Ang Chen, Sandeep K. Gupta: A Satisfiability-Based Test Generator for Path Delay Faults in Combinational Circuts. DAC 1996: 209-214
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Ang Chen, Sandeep K. Gupta: BIST Test Pattern Generators for Two-Pattern Testing-Theory and Design Algorithms. IEEE Trans. Computers 45(3): 257-269 (1996)
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Ang Chen, Sandeep K. Gupta: Design of efficient BIST test pattern generators for delay testing. IEEE Trans. on CAD of Integrated Circuits and Systems 15(12): 1568-1575 (1996)
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Ang Chen, Sandeep K. Gupta: A Methodology to Design Efficient BIST Test Pattern Generators. ITC 1995: 814-823
2no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Ang Chen, Sandeep K. Gupta: BIST Test Pattern Generators for Stuck-Open and Delay Testing. EDAC-ETC-EUROASIC 1994: 289-296

Selection of 6 from 7 records - Chih-Ang Chen has 4 coauthors

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