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| 1 | Markus P. J. Mergens, Geert Wybo, Bart Keppens, Benjamin Van Camp, Frederic De Ranter, Koen G. Verhaege, John Armer, Phillip Jozwiak, Christian C. Russ: ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies. ISCAS (2) 2005: 1194-1197 |
Selection of 1 from 3 records - Benjamin Van Camp has 11 coauthors
Last update 2012-09-10 CET by the DBLP Team —
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