Bing-Chu Cai (Selection)

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3 Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai: Some practical considerations for effective and efficient wafer-level reliability control. Microelectronics Reliability 44(8): 1233-1243 (2004)

2 Summer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai: A cost-effective wafer-level reliability test system for integrated circuit makers. IEEE T. Instrumentation and Measurement 52(5): 1458-1467 (2003)

1 Summer F. C. Tseng, Wei-Ting Kary Chien, Bing-Chu Cai: Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation. Microelectronics Reliability 43(5): 713-724 (2003)

Selection of 3 from 6 records - Bing-Chu Cai has 18 coauthors

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3		Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai: Some practical considerations for effective and efficient wafer-level reliability control. Microelectronics Reliability 44(8): 1233-1243 (2004)
2		Summer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai: A cost-effective wafer-level reliability test system for integrated circuit makers. IEEE T. Instrumentation and Measurement 52(5): 1458-1467 (2003)
1		Summer F. C. Tseng, Wei-Ting Kary Chien, Bing-Chu Cai: Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation. Microelectronics Reliability 43(5): 713-724 (2003)