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Giovanni Busatto (Selection)

G. Busatto

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1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLG. Busatto, B. Cascone, L. Fratelli, M. Balsamo, Francesco Iannuzzo, F. Velardi: Non-destructive high temperature characterisation of high-voltage IGBTs. Microelectronics Reliability 42(9-11): 1635-1640 (2002)

Selection of 1 from 19 records - Giovanni Busatto has 21 coauthors

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