Soumitra Bose (Selection)

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11 Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal: Deriving Logic Systems for Path Delay Test Generation. IEEE Trans. Computers 47(8): 829-846 (1998)

8 Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal: Generation of Compact Delay Tests by Multiple-Path Activation. ITC 1993: 714-723

7 Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal: A Path Delay Fault Simulator for Sequential Circuits. VLSI Design 1993: 269-274

6 Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal: Path delay fault simulation of sequential circuits. IEEE Trans. VLSI Syst. 1(4): 453-461 (1993)

5 Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal: The optimistic update theorem for path delay testing in sequential circuits. J. Electronic Testing 4(3): 285-290 (1993)

4 Soumitra Bose, Prathima Agrawal: Concurrent Fault Simulation of Logic Gates and Memory Blocks on Message Passing Multicomputers. DAC 1992: 332-335

Selection of 6 from 17 records - Soumitra Bose has 9 coauthors

11		Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal: Deriving Logic Systems for Path Delay Test Generation. IEEE Trans. Computers 47(8): 829-846 (1998)
8		Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal: Generation of Compact Delay Tests by Multiple-Path Activation. ITC 1993: 714-723
7		Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal: A Path Delay Fault Simulator for Sequential Circuits. VLSI Design 1993: 269-274
6		Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal: Path delay fault simulation of sequential circuits. IEEE Trans. VLSI Syst. 1(4): 453-461 (1993)
5		Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal: The optimistic update theorem for path delay testing in sequential circuits. J. Electronic Testing 4(3): 285-290 (1993)
4		Soumitra Bose, Prathima Agrawal: Concurrent Fault Simulation of Logic Gates and Memory Blocks on Message Passing Multicomputers. DAC 1992: 332-335