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| 7 | Vikas Mehrotra, Shiou Lin Sam, Duane S. Boning, Anantha Chandrakasan, Rakesh Vallishayee, Sani R. Nassif: A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance. DAC 2000: 172-175 |
Selection of 1 from 22 records - Duane S. Boning has 56 coauthors
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