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| 1 | Huimin Xie, Anand Asundi, Chai Gin Boay, Lu Yunguang, Jin Yu, Zhaowei Zhong, Bryan K. A. Ngoi: High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package. Microelectronics Reliability 42(8): 1219-1227 (2002) |
Selection of 1 from 1 records - Chai Gin Boay has 6 coauthors
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