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R. D. (Shawn) Blanton (Selection)

Ronald D. Blanton

List of publications from the DBLP Bibliography Server - FAQ
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89Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. D. (Shawn) Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku: Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations. IEEE Design & Test of Computers 29(1): 36-47 (2012)
78Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJeffrey E. Nelson, Wing Chiu Tam, Ronald D. Blanton: Automatic classification of bridge defects. ITC 2010: 305-314
55Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton: Multiple-detect ATPG based on physical neighborhoods. DAC 2006: 1099-1102
54Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton: Extraction of defect density and size distributions from wafer sort test results. DATE 2006: 913-918
50Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer: Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers 23(5): 390-400 (2006)
41Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLThomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary: Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. ITC 2004: 508-517

Selection of 6 from 90 records - R. D. (Shawn) Blanton has 68 coauthors

Last update 2012-09-10 CET by the DBLP TeamThis material is Open Data Content released under the ODC-BY 1.0 license — See also our legal information page