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| 1 | Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks: Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. ITC 1982: 541-547 |
Selection of 1 from 5 records - Alan Blair has 19 coauthors
Copyright © 2009-12-24 by Michael Ley (ley@uni-trier.de)