Sudipta Bhawmik (Selection)

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8 Huan-Chih Tsai, Kwang-Ting Cheng, Chih-Jen Lin, Sudipta Bhawmik: Efficient test-point selection for scan-based BIST. IEEE Trans. VLSI Syst. 6(4): 667-676 (1998)

7 Huan-Chih Tsai, Kwang-Ting Cheng, Chih-Jen Lin, Sudipta Bhawmik: A Hybrid Algorithm for Test Point Selection for Scan-Based BIST. DAC 1997: 478-483

5 Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik: Integration of partial scan and built-in self-test. J. Electronic Testing 7(1-2): 125-137 (1995)

4 Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik: PSBIST: A Partial-Scan Based Built-In Self-Test Scheme. ITC 1993: 507-516

3 Tapan J. Chakraborty, Sudipta Bhawmik, Robert Bencivenga, Chih-Jen Lin: Enhanced Controllability for I_DDQ Test Sets Using Partial Scan. DAC 1991: 278-281

Selection of 5 from 20 records - Sudipta Bhawmik has 24 coauthors

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8		Huan-Chih Tsai, Kwang-Ting Cheng, Chih-Jen Lin, Sudipta Bhawmik: Efficient test-point selection for scan-based BIST. IEEE Trans. VLSI Syst. 6(4): 667-676 (1998)
7		Huan-Chih Tsai, Kwang-Ting Cheng, Chih-Jen Lin, Sudipta Bhawmik: A Hybrid Algorithm for Test Point Selection for Scan-Based BIST. DAC 1997: 478-483
5		Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik: Integration of partial scan and built-in self-test. J. Electronic Testing 7(1-2): 125-137 (1995)
4		Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik: PSBIST: A Partial-Scan Based Built-In Self-Test Scheme. ITC 1993: 507-516
3		Tapan J. Chakraborty, Sudipta Bhawmik, Robert Bencivenga, Chih-Jen Lin: Enhanced Controllability for I_DDQ Test Sets Using Partial Scan. DAC 1991: 278-281